Transistor Test Set CT 537

The Avo Transistor Test Set provides, in one instrument,facilities for both transistor and diode testing. The Test Set is a compact, simple to operate, direct reading instrument, providing an accurate and convenient method for the measurement of transistor and diode characteristics.

Provision is made for the rapid and accurate measurement of transistor hfe up to 1500 at a frequency of approximately 1 kc/s and the measurement of leakage current between 1microA and 400mA for both p.n.p. and n.p.n. low and medium power germanium or silicon transistors.

Both the forward and reverse characteristics of diodes can be measured, the reverse at voltages up to 1000V under current limiting conditions.

The CT537 is the military version of the model TT537 with minimal difference in the layout of panels. The main difference being the meter, Avo sealed instrument with cut-out for the CT model, while for the TT is used a Taylor meter 50 with no cut-out.

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